Advanced Computing In Electron Microscopy
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Advanced Computing in Electron Microscopy
Author: Earl J. Kirkland
language: en
Publisher: Springer Science & Business Media
Release Date: 2010-08-12
Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.
Advanced Computing in Electron Microscopy
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Characterization of Nanomaterials in Complex Environmental and Biological Media
Characterization of Nanomaterials in Complex Environmental and Biological Media covers the novel properties of nanomaterials and their applications to consumer products and industrial processes. The book fills the growing gap in this challenging area, bringing together disparate strands in chemistry, physics, biology, and other relevant disciplines. It provides an overview on nanotechnology, nanomaterials, nano(eco)toxicology, and nanomaterial characterization, focusing on the characterization of a range of nanomaterial physicochemical properties of relevance to environmental and toxicological studies and their available analytical techniques. Readers will find a multidisciplinary approach that provides highly skilled scientists, engineers, and technicians with the tools they need to understand and interpret complicated sets of data obtained through sophisticated analytical techniques. - Addresses the requirements, challenges, and solutions for nanomaterial characterization in environmentally complex media - Focuses on technique limitations, appropriate data collection, data interpretation, and analysis - Aids in understanding and comparing nanomaterial characterization data reported in the literature using different analytical tools - Includes case studies of characterization relevant complex media to enhance understanding