Accuracy Verification Methods
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Accuracy Verification Methods
Author: Olli Mali
language: en
Publisher: Springer Science & Business Media
Release Date: 2013-10-27
The importance of accuracy verification methods was understood at the very beginning of the development of numerical analysis. Recent decades have seen a rapid growth of results related to adaptive numerical methods and a posteriori estimates. However, in this important area there often exists a noticeable gap between mathematicians creating the theory and researchers developing applied algorithms that could be used in engineering and scientific computations for guaranteed and efficient error control. The goals of the book are to (1) give a transparent explanation of the underlying mathematical theory in a style accessible not only to advanced numerical analysts but also to engineers and students; (2) present detailed step-by-step algorithms that follow from a theory; (3) discuss their advantages and drawbacks, areas of applicability, give recommendations and examples.
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
High Accuracy Surface Modeling Method: The Robustness
This book focuses on the robustness analysis of high accuracy surface modeling method (HASM) to yield good performance of it. Understanding the sensitivity and uncertainty is important in model applications. The book aims to advance an integral framework for assessing model error that can demonstrate robustness across sets of possible controls, variable definitions, standard error, algorithm structure, and functional forms. It is an essential reference to the most promising numerical models. In areas where there is less certainty about models, but also high expectations of transparency, robustness analysis should aspire to be as broad as possible. This book also contains a chapter at the end featuring applications in climate simulation illustrating different implementations of HASM in surface modeling. The book is helpful for people involved in geographical information science, ecological informatics, geography, earth observation, and planetary surface modeling.