A Survey On 3d Cameras Metrological Comparison Of Time Of Flight Structured Light And Active Stereoscopy Technologies
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A Survey on 3D Cameras: Metrological Comparison of Time-of-Flight, Structured-Light and Active Stereoscopy Technologies
This book is a valuable resource to deeply understand the technology used in 3D cameras. In this book, the authors summarize and compare the specifications of the main 3D cameras available in the mass market. The authors present a deep metrological analysis of the main camera based on the three main technologies: Time-of-Flight, Structured-Light and Active Stereoscopy, and provide qualitative results for any user to understand the underlying technology within 3D camera, as well as practical guidance on how to get the most of them for a given application.
Handbook of Metrology and Applications
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
Near-sensor and In-sensor Computing
This book provides a detailed introduction to near-sensor and in-sensor computing paradigms, their working mechanisms, development trends and future directions. The authors also provide a comprehensive review of current progress in this area, analyze existing challenges in the field, and offer possible solutions. Readers will benefit from the discussion of computing approaches that intervene in the vicinity of or inside sensory networks to help process data more efficiently, decreasing power consumption and reducing the transfer of redundant data between sensing and processing units. Provides readers with a detailed introduction to the near-sensor and in-sensor computing paradigms; Includes in-depth and comprehensive summaries of the state-of-the-art development in this field; Discusses and compares various neuromorphic sensors and neural networks: Describes integration technology for near-/in-sensor computing; Reveals the relationship between near-/in-sensor computing and other computing paradigms, such as neuromorphic computing, edge computing, intuitive computing, and in-memory computing.