Introduction To Scanning Trans
Download Introduction To Scanning Trans PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Introduction To Scanning Trans book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages.
Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Transmission Electron Microscopy
Author: David B. Williams
language: en
Publisher: Springer Science & Business Media
Release Date: 2009-07-31
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: `The best textbook for this audience available.' – American Scientist `Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.' – Microscope `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' – Micron `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' – MRS Bulletin, May 1998 `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' – from the Foreword by Professor Gareth Thomas, University of California, Berkeley
Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.